Automated large-area Plasma FIB delayering & in-situ nanoprobing of the most current semiconductor devices

Join us for webinar that promises to bring new insights to semiconductor device analysis. Organized jointly by TESCAN Group and Imina Technologies, this session will delve into innovative methods for automated large-area Plasma FIB delayering and in-situ nanoprobing of advanced semiconductor devices.

Speakers:
Lukas Hladik, Ph.D., Product Marketing Manager (TESCAN Group)
Guillaume Boetsch, Co-founder of Imina Technologies

Status: Recorded Video is available for reviewing