NS-3800 3D Confocal Laser Scanning Microscope (CLSM): High-speed nano-metrology solution

Overview of the NS-3800 System
Key Breakthrough Features
Technical Specifications
Industrial Applications
Frequently Asked Questions (FAQ)
Related Video / Webinar
Contact & Support

Overview of the NS-3800 System

The NS-3800 series inherits the powerful technology of the NS-3500 but is optimized for compact size and processing speed. This non-contact 3D measurement device utilizes a 405nm Violet Laser to reconstruct surface maps with nanometer-level precision.With its modular and lightweight design, the NS-3800 can be easily integrated directly into automated inspection systems or semiconductor and FPD (Flat Panel Display) production lines without occupying significant space.

Key Breakthrough Features

Non-destructive 3D Measurement: Collects surface data without physical contact, eliminating risks of sample scratching or contamination.
Hybrid Scanning System: Combines Piezo Actuator (PZT) for ultra-fine resolution and a Step Motor for wide-range measurements.
High-Speed Auto-focus: Advanced laser focusing algorithms significantly reduce measurement time per sample.
Real-time Visualization: Integrated color CCD camera for optical imaging alongside Confocal Laser sensors for precise 3D data.

Technical Specifications

Characteristic	Specifications
Laser Source	Violet Laser (405 nm)
Z-axis Display Resolution	0.001 μm (1 nm)
Repeatability	σ ≤ 0.010 μm
Z-Scanning Method	PZT (Fine) & Step Motor (Long)
Analysis Software	NSWorks / NSViewer

Industrial Applications

The NS-3800 is trusted across various high-tech sectors due to its versatile measurement capabilities:

Semiconductor & FPD: Measuring bump heights, inspecting ITO thin-film structures, and pillar spacing.
Electronics Manufacturing: PCB defect analysis and surface roughness measurement for MEMS devices.
Material Science: Researching solar cells, material wear, and 3D micro-morphology.

Frequently Asked Questions (FAQ)

Can the NS-3800 be integrated into third-party automated inspection machines?

Absolutely. With its compact footprint and support for standard communication protocols, the NS-3800 is designed to function as an OEM measurement module.
What is the main difference between the NS-3800 and AFM (Atomic Force Microscope)?

The NS-3800 offers significantly faster scanning speeds and a much larger Field of View (FOV), making it ideal for rapid production line inspection, whereas AFM focuses on atomic resolution at very slow speeds.
Does the software support exporting data to other formats?

Yes, the bundled software allows exporting 3D data and measurement reports in standard formats for in-depth analysis.