Webinar

TESCAN FIB-SEM:

"Taking multimodal materials characterization further with plasma FIB-SEM"

by TESCAN USA
Speaker: Dean Miller TESCAN USA, Inc.

In this webinar, attendees will learn about:

• Challenges and innovations in focused ion beam technology in materials science
• Ga-free sample preparation examples using Xe plasma FIB-SEM
• Multi-modal approach for analyzing materials
• Basics of 3D microanalysis in FIB-SEM
• Application examples of using plasma FIB-SEM in materials science

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Miễn phí

FIB-SEM - Kính hiển vi điện tử quét chùm ion hội tụ

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